Quantitative phase imaging by automated Cepstrum-based interferometric microscopy (CIM)
- Rubio-Oliver, R.
- Micó, V.
- Zalevsky, Z.
- García, J.
- Angel Picazo-Bueno, J.
Revista:
Optics and Laser Technology
ISSN: 0030-3992
Ano de publicación: 2024
Volume: 177
Tipo: Artigo