Quantitative phase imaging by automated Cepstrum-based interferometric microscopy (CIM)
- Rubio-Oliver, R.
- Micó, V.
- Zalevsky, Z.
- García, J.
- Angel Picazo-Bueno, J.
Zeitschrift:
Optics and Laser Technology
ISSN: 0030-3992
Datum der Publikation: 2024
Ausgabe: 177
Art: Artikel