Quantitative phase imaging by automated Cepstrum-based interferometric microscopy (CIM)
- Rubio-Oliver, R.
- Micó, V.
- Zalevsky, Z.
- García, J.
- Angel Picazo-Bueno, J.
Revue:
Optics and Laser Technology
ISSN: 0030-3992
Année de publication: 2024
Volumen: 177
Type: Article