Quantitative phase imaging by automated Cepstrum-based interferometric microscopy (CIM)

1. Rubio-Oliver, R.
2. Micó, V.
3. Zalevsky, Z.
4. García, J.
5. Angel Picazo-Bueno, J.

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DOI: 10.1016/J.OPTLASTEC.2024.111121 GOOGLE SCHOLAR lock_openSarbide irekia editor

Datuen iturria: Scopus