Quantitative phase imaging by automated Cepstrum-based interferometric microscopy (CIM)

  1. Rubio-Oliver, R.
  2. Micó, V.
  3. Zalevsky, Z.
  4. García, J.
  5. Angel Picazo-Bueno, J.
Revista:
Optics and Laser Technology

ISSN: 0030-3992

Any de publicació: 2024

Volum: 177

Tipus: Article

DOI: 10.1016/J.OPTLASTEC.2024.111121 GOOGLE SCHOLAR lock_openAccés obert editor
Font de les dades: Scopus