New power MOSFET selection method to avoid failures
- Jordán, J.
- Esteve, V.
- García-Gil, R.
- Sanchis, E.
- Maset, E.
- Dede, E.
Proceedings:
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Year of publication: 2004
Volume: 2
Pages: 1257-1261
Type: Conference paper