Multi-pulse characterization of trapping/detrapping mechanisms in AlGaN/GaN high electromobility transistors

  1. Martínez, P.J.
  2. Maset, E.
  3. Gilabert, D.
  4. Sanchis-Kilders, E.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 1361-6641,  0268-1242

Argitalpen urtea: 2019

Alea: 34

Zenbakia: 10

Mota: Artikulua

DOI: 10.1088/1361-6641/AB3FE8 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus