Multi-pulse characterization of trapping/detrapping mechanisms in AlGaN/GaN high electromobility transistors

  1. Martínez, P.J.
  2. Maset, E.
  3. Gilabert, D.
  4. Sanchis-Kilders, E.
Journal:
Semiconductor Science and Technology

ISSN: 1361-6641,  0268-1242

Year of publication: 2019

Volume: 34

Issue: 10

Type: Article

DOI: 10.1088/1361-6641/AB3FE8 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus