Atomic Force Microscopy beyond Topography: Chemical Sensing of 2D Material Surfaces through Adhesion Measurements
- Brotons-Alcázar, I.
- Terreblanche, J.S.
- Giménez-Santamarina, S.
- Gutiérrez-Finol, G.M.
- Ryder, K.S.
- Forment-Aliaga, A.
- Coronado, E.
ISSN: 1944-8252, 1944-8244
Year of publication: 2024
Volume: 16
Issue: 15
Pages: 19711-19719
Type: Article