Mirror effect in atomic force microscopy profiles enables tip reconstruction
- Marques-Moros, F.
- Forment-Aliaga, A.
- Pinilla-Cienfuegos, E.
- Canet-Ferrer, J.
Revue:
Scientific Reports
ISSN: 2045-2322
Année de publication: 2020
Volumen: 10
Número: 1
Type: Article