SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark

  1. Marroqui, D.
  2. Garrigos, A.
  3. Blanes, J.M.
  4. Gutierrez, R.
  5. Maset, E.
  6. Iannuzzo, F.
Aldizkaria:
Microelectronics Reliability

ISSN: 0026-2714

Argitalpen urtea: 2019

Alea: 100-101

Mota: Artikulua

DOI: 10.1016/J.MICROREL.2019.113429 GOOGLE SCHOLAR
Datuen iturria: Scopus