SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark
- Marroqui, D.
- Garrigos, A.
- Blanes, J.M.
- Gutierrez, R.
- Maset, E.
- Iannuzzo, F.
Journal:
Microelectronics Reliability
ISSN: 0026-2714
Year of publication: 2019
Volume: 100-101
Type: Article