Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

  1. Banon-Caballero, D.
  2. Socuellamos, J.M.
  3. Mata, R.
  4. Mercade, L.
  5. Gimeno, B.
  6. Boria, V.E.
  7. Raboso, D.
  8. Semenov, V.E.
  9. Rakova, E.I.
  10. Sanchez-Royo, J.F.
  11. Segura, A.
Revue:
IEEE Transactions on Plasma Science

ISSN: 0093-3813

Année de publication: 2018

Volumen: 46

Número: 4

Pages: 859-867

Type: Révision

DOI: 10.1109/TPS.2018.2809602 GOOGLE SCHOLAR

Objectifs de Développement Durable