Refractive index of GaTe under high pressure

  1. Pellicer-Porres, J.
  2. Segura, A.
  3. Muñoz, V.
  4. Chervin, J.C.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 2000

Volumen: 15

Número: 9

Pages: 902-907

Type: Article

DOI: 10.1088/0268-1242/15/9/305 GOOGLE SCHOLAR
La source de données: Scopus