Dielectric and structural properties of PST films deposited by RF ion sputtering on LSCO/Si substrates

  1. Martinez, E.
  2. Fundora, A.
  3. Blanco, O.
  4. Siqueiros, J.M.
Aktak:
Ferroelectrics

ISSN: 0015-0193 1563-5112

Argitalpen urtea: 2003

Alea: 293

Orrialdeak: 153-159

Mota: Biltzar ekarpena

DOI: 10.1080/00150190390238351 GOOGLE SCHOLAR