Dielectric and structural properties of PST films deposited by RF ion sputtering on LSCO/Si substrates

  1. Martinez, E.
  2. Fundora, A.
  3. Blanco, O.
  4. Siqueiros, J.M.
Proceedings:
Ferroelectrics

ISSN: 0015-0193,  1563-5112

Year of publication: 2003

Volume: 293

Pages: 153-159

Type: Conference paper

DOI: 10.1080/00150190390238351 GOOGLE SCHOLAR
Data source: Scopus