Coherent microscopy for 3-D movement monitoring and super-resolved imaging

  1. Beiderman, Y.
  2. Amsel, A.
  3. Tzadka, Y.
  4. Fixler, D.
  5. Teicher, M.
  6. Micó, V.
  7. García, J.
  8. Javidi, B.
  9. DaneshPanah, M.
  10. Moon, I.
  11. Zalevsky, Z.
Collection de livres:
Springer Series in Surface Sciences

ISSN: 0931-5195

ISBN: 9783642158124

Année de publication: 2011

Volumen: 46

Número: 1

Pages: 269-293

Type: Article

DOI: 10.1007/978-3-642-15813-1_10 GOOGLE SCHOLAR