Coherent microscopy for 3-D movement monitoring and super-resolved imaging
- Beiderman, Y.
- Amsel, A.
- Tzadka, Y.
- Fixler, D.
- Teicher, M.
- Micó, V.
- García, J.
- Javidi, B.
- DaneshPanah, M.
- Moon, I.
- Zalevsky, Z.
ISSN: 0931-5195
ISBN: 9783642158124
Année de publication: 2011
Volumen: 46
Número: 1
Pages: 269-293
Type: Article