Evidence of dynamic-R on degradation on low-dose 60Co gamma radiation AlGaN/GaN HEMTs

  1. Martínez, P.J.
  2. Maset, E.
  3. Gilabert, D.
  4. Sanchis-Kilders, E.
  5. Ejea, J.B.
Journal:
Semiconductor Science and Technology

ISSN: 1361-6641,  0268-1242

Year of publication: 2018

Volume: 33

Issue: 11

Type: Article

DOI: 10.1088/1361-6641/AAE616 GOOGLE SCHOLAR
Data source: Scopus