Application of the SKYRAD improved Langley plot method for the in situ calibration of CIMEL Sun-sky photometers

  1. Campanelli, M.
  2. Estellés, V.
  3. Tomasi, C.
  4. Nakajima, T.
  5. Malvestuto, V.
  6. Martínez-Lozano, J.A.
Aldizkaria:
Applied Optics

ISSN: 1539-4522,  1559-128X

Argitalpen urtea: 2007

Alea: 46

Zenbakia: 14

Orrialdeak: 2688-2702

Mota: Artikulua

DOI: 10.1364/AO.46.002688 GOOGLE SCHOLAR
Datuen iturria: Scopus