Defects analysis of in situ grown BiSrCaCuO thin films
- Ranno, L.
- Defourneau, R.M.
- Enard, J.P.
- Perrière, J.
- Martinez-Garcia, D.
ISSN: 0925-8388
Year of publication: 1993
Volume: 195
Issue: C
Pages: 251-254
Type: Article
ISSN: 0925-8388
Year of publication: 1993
Volume: 195
Issue: C
Pages: 251-254
Type: Article