Publicaciones en las que colabora con JOSE ANTONIO SOBRINO RODRIGUEZ (19)

2019

  1. Demonstration of the event identification capabilities of the NEXT-White detector

    Journal of High Energy Physics, Vol. 2019, Núm. 10

  2. Electroluminescence TPCs at the thermal diffusion limit

    Journal of High Energy Physics, Vol. 2019, Núm. 1

  3. Energy calibration of the NEXT-White detector with 1% resolution near Q ββ of 136Xe

    Journal of High Energy Physics, Vol. 2019, Núm. 10

  4. Radiogenic backgrounds in the NEXT double beta decay experiment

    Journal of High Energy Physics, Vol. 2019, Núm. 10

2018

  1. Calibration of the NEXT-White detector using 83mKr decays

    Journal of Instrumentation, Vol. 13, Núm. 10

  2. Electron drift properties in high pressure gaseous xenon

    Journal of Instrumentation, Vol. 13, Núm. 7

  3. Helium–Xenon mixtures to improve the topological signature in high pressure gas xenon TPCs

    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 905, pp. 82-90

  4. High voltage insulation and gas absorption of polymers in high pressure argon and xenon gases

    Journal of Instrumentation, Vol. 13, Núm. 10

  5. Initial results on energy resolution of the NEXT-White detector

    Journal of Instrumentation, Vol. 13, Núm. 10

  6. Measurement of radon-induced backgrounds in the NEXT double beta decay experiment

    Journal of High Energy Physics, Vol. 2018, Núm. 10

  7. PETALO read-out: A novel approach for data acquisition systems in PET applications

    2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings

  8. Study of the loss of xenon scintillation in xenon-trimethylamine mixtures

    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 905, pp. 22-28

  9. The NEXT White (NEW) detector

    Journal of Instrumentation, Vol. 13, Núm. 12

2017

  1. Background rejection in NEXT using deep neural networks

    Journal of Instrumentation, Vol. 12, Núm. 1