Fotónica y semiconductores
FOSE
University of Paris-Sorbonne
París, FranciaPublicaciones en colaboración con investigadores/as de University of Paris-Sorbonne (4)
2013
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Measurement of the branching fractions of the decays Bs0→D ̄ 0K-π+ and B0→D ̄0K+π-
Physical Review D - Particles, Fields, Gravitation and Cosmology, Vol. 87, Núm. 11
1994
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Growth of oxide thin films by laser ablation
Proceedings of SPIE - The International Society for Optical Engineering
1993
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Defects analysis of in situ grown BiSrCaCuO thin films
Journal of Alloys and Compounds, Vol. 195, Núm. C, pp. 251-254
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Phase intergrowth in Bi2Sr2Can-1CunOy thin films
Physical Review B, Vol. 48, Núm. 18, pp. 13945-13948