The Stacking Faulted Nature of the Narrow Gap Semiconductor Sc2Si2Te6
- Pielnhofer, F.
- Bette, S.
- Eger, R.
- Duppel, V.
- Nuss, J.
- Dolle, C.
- Dinnebier, R.E.
- Lotsch, B.V.
ISSN: 1521-3749, 0044-2313
Year of publication: 2022
Volume: 648
Issue: 21
Type: Article