Cepstrum-based interferometric microscopy (CIM) for quantitative phase imaging
- Rubio-Oliver, R.
- García, J.
- Zalevsky, Z.
- Picazo-Bueno, J.Á.
- Micó, V.
Aldizkaria:
Optics and Laser Technology
ISSN: 0030-3992
Argitalpen urtea: 2024
Alea: 174
Mota: Artikulua