Winter wheat yield assessment from Landsat 8 and Sentinel-2 data: Incorporating surface reflectance, through phenological fitting, into regression yield models
- Skakun, S.
- Vermote, E.
- Franch, B.
- Roger, J.-C.
- Kussul, N.
- Ju, J.
- Masek, J.
Aldizkaria:
Remote Sensing
ISSN: 2072-4292
Argitalpen urtea: 2019
Alea: 11
Zenbakia: 15
Mota: Artikulua
