Reliable determination of the Cu/n-Si Schottky barrier height by using in-device hot-electron spectroscopy
- Parui, S.
- Atxabal, A.
- Ribeiro, M.
- Bedoya-Pinto, A.
- Sun, X.
- Llopis, R.
- Casanova, F.
- Hueso, L.E.
Journal:
Applied Physics Letters
ISSN: 0003-6951
Year of publication: 2015
Volume: 107
Issue: 18
Type: Article