Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode

1. Vecchiola, A.
2. Chrétien, P.
3. Delprat, S.
4. Bouzehouane, K.
5. Schneegans, O.
6. Seneor, P.
7. Mattana, R.
8. Tatay, S.
9. Geffroy, B.
10. Bonnassieux, Y.
11. Mencaraglia, D.
12. Houzé, F.