Motional Resistance Evaluation of the Quartz Crystal Microbalance to Study the Formation of a Passive Layer in the Interfacial Region of a Copper|Diluted Sulfuric Solution

  1. Cuenca, A.
  2. Agrisuelas, J.
  3. Catalán, R.
  4. García-Jareño, J.J.
  5. Vicente, F.
Aldizkaria:
Langmuir

ISSN: 1520-5827 0743-7463

Argitalpen urtea: 2015

Alea: 31

Zenbakia: 35

Orrialdeak: 9655-9664

Mota: Artikulua

DOI: 10.1021/ACS.LANGMUIR.5B02233 GOOGLE SCHOLAR