New method for the determination of the defect profile in thin layers grown over a substrate

  1. Zubiaga, A.
  2. García, J.A.
  3. Plazaola, F.
  4. Tuomisto, F.
  5. Zúñiga, J.
  6. Muñoz-Sanjosé, V.
Aldizkaria:
Physica Status Solidi (C) Current Topics in Solid State Physics

ISSN: 1862-6351

Argitalpen urtea: 2007

Alea: 4

Zenbakia: 10

Orrialdeak: 3973-3976

Mota: Biltzar ekarpena

DOI: 10.1002/PSSC.200675733 GOOGLE SCHOLAR
Datuen iturria: Scopus