Accelerated life test for siC schottky blocking diodes in high-temperature environment

  1. Maset, E.
  2. Sanchis-Kilders, E.
  3. Ejea, J.B.
  4. Ferreres, A.
  5. Jordán, J.
  6. Esteve, V.
  7. Brosselard, P.
  8. Jordà, X.
  9. Vellvehi, M.
  10. Godignon, P.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1530-4388 1530-4388

Year of publication: 2009

Volume: 9

Issue: 4

Pages: 557-562

Type: Conference paper

DOI: 10.1109/TDMR.2009.2029090 GOOGLE SCHOLAR