Accelerated life test for siC schottky blocking diodes in high-temperature environment
- Maset, E.
- Sanchis-Kilders, E.
- Ejea, J.B.
- Ferreres, A.
- Jordán, J.
- Esteve, V.
- Brosselard, P.
- Jordà, X.
- Vellvehi, M.
- Godignon, P.
ISSN: 1530-4388, 1530-4388
Year of publication: 2009
Volume: 9
Issue: 4
Pages: 557-562
Type: Conference paper