Analysis of spatially and temporally overlapping events with application to image sequences

  1. Ayala, G.
  2. Sebastian, R.
  3. Díaz, M.E.
  4. Díaz, E.
  5. Zoncu, R.
  6. Toomre, D.
Journal:
IEEE Transactions on Pattern Analysis and Machine Intelligence

ISSN: 0162-8828

Year of publication: 2006

Volume: 28

Issue: 10

Pages: 1707-1712

Type: Article

DOI: 10.1109/TPAMI.2006.199 GOOGLE SCHOLAR
Data source: Scopus