Investigation of the local structure of As-related acceptor centres in InSe by means of fluorescence-detected XAS

  1. Pellicer-Porres, J.
  2. Ferrer-Roca, Ch.
  3. Segura, A.
  4. Jacquamet, L.
  5. Chevy, A.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 2002

Volumen: 17

Número: 9

Pages: 1023-1027

Type: Article

DOI: 10.1088/0268-1242/17/9/321 GOOGLE SCHOLAR
La source de données: Scopus