Microscopía de barrido con muestreo espacial del plano del detector

  1. Sánchez-Ortiga, Emilio
  2. Saavedra, Genaro
  3. Sheppard, Colin
  4. Doblas, Ana
  5. Martínez Corral, Manuel
  6. Andrés Bou, Pedro
Aldizkaria:
Óptica pura y aplicada

ISSN: 2171-8814

Argitalpen urtea: 2013

Zenbakien izenburua: Special: 10th Spanish National Meeting on Optics

Alea: 46

Zenbakia: 2

Orrialdeak: 137-146

Mota: Artikulua

DOI: 10.7149/OPA.46.2.137 DIALNET GOOGLE SCHOLAR lock_openSarbide irekia editor

Beste argitalpen batzuk: Óptica pura y aplicada

Laburpena

We present the implementation of a confocal scanning microscope in which the signal detection is performed through a matrix sensor, specifically, a CCD camera. This kind of detection has several advantages over the conventional detection in confocal microscopes. One of those advantages is the possibility to recover information of the sample that vanishes when the confocal image is directly acquired by the integration of light into a signal. We demonstrate the applicability of the system which allows implementing super-resolution techniques in a very easy manner.

Datuen iturria: Dialnet